A method for replacing defective memory cells of a random access memory device of a data processing apparatus, in which, during the operation of the data processing apparatus, a defective memory cell is replaced by a replacement memory cell in the random access memory device by using a control instruction. 0 and the polymer bears a halogen atom at a terminal of the polymer chain. The circuitry may divide the sorted image data into a plurality of time slots and calculate, based on features of the designated image data corresponding to each time slot of the plurality of time slots, a time slot score for each of the plurality of time slots. When two or more toys with the internal chambers are combined the food may flow from the chamber of one toy into another toy several times before exiting the toy system. A sputter etch, typically of the reactive type, is then performed to substantially remove the diffusion-barrier material overlying the dielectric layer.