Aspects of the subject matter described herein relate to resource replication systems. A methodology based on measuring the quality factor of the transponder is employed to detect a specific species of transponder or measure a parameter that alters the transponders quality factor. A transistor may comprise the composite dielectric as a gate dielectric. In preferred embodiments the inserts have a top surface with a plurality of ribs positioned inwardly from the wafer periphery for supporting the wafers with minimal contact.