Semiconductor device and semiconductor memory device include a plurality of internal circuits configured to perform test operations in response to their respective test mode signals and a plurality of test-mode control units configured to control the test operations of the internal circuits to be disabled in response to a test-off signal. The cleaning assembly includes an elongated maneuvering wand having a handle portion and a distal implement attachment end thereof. Also disclosed is a rear shell elbow for an electrical connector that is assembled from a pair of slidably interlocking members that form an X-shaped divider within the rear shell when assembled. The method includes charging a fee to an appropriate account for the selected coverage type and amount. Deflection of the optical fiber translates into movement of the light beam over the detector, allowing measurement of the speed and direction of the fluid flow in two orthogonal planes.