A novel planarizing probe card for testing a semiconductor device is presented. The interface apparatus for a semiconductor integrated circuit includes an output block configured to output differential signals output by an internal circuit a detector configured to detect a timing error of the differential signals; and a controller configured to control a timing of the differential signals output by the internal circuit according to a detection result of the detector. In a first embodiment, the first ACKNAK response repeats preempting any ACKNAK response to the later PDSCH transmission. The fourth lens and the fifth lens are attached to each other. At the same time, the video content is correspondingly made less or more visible. The platen has a vise plate to support the bill of a cap and a face plate attached to the vise plate to hold the crown of cap.