The invention described herein represents a significant advancement in systems that enable a user to control systems and input data into a very wide range of systems. A MOS transistor includes a source region and a drain region disposed in an active region of a semiconductor substrate and spaced apart from each other. In the present invention, the scan lines corresponding to the multiple sub-pixels are disposed side by side such that increasing the width of the first black matrix between adjacent pixel units and vertical viewing angle and do not reduce the aperture ratio. The test module, which contains a digital voltage detector, is more accurate than prior analog voltage detectors. The next scheduled queue or highest priority queue in the tree is then serviced by outputting at least some of its data.