A lock-out device is provided that determines whether to lock out a chip or not according to the result of operation voltage drop detected at a plurality of positions in a semiconductor integrated circuit device. In one particular exemplary embodiment, the technique may be realized by a mechanism that allows one end of the original pseudo-wire to dynamically and automatically establish a backup pseudo-wire to an alternate destination without requiring an operator intervention or manual configuration of alternate destinations. The third link is adapted to engage an inner wall in the passage. Accordingly, the user can change the setting of the image-forming apparatus so that the facsimile can be received. The output port has a positive terminal electrically connected to the common terminal of the open-loop transistor and a negative terminal electrically connected to non-common output terminal of the closed-loop transistor.