A device for testing small electronic components includes a test plate for moving a plurality of spaced electronic components to a test station. The method includes a step of processing captured data for the deformed head utilizing Principal Component Analysis to generate PCA data representative of the deformed head. Each light channel is modulated by a predetermined set of orthogonal codes so that neighboring channel interferences can be minimized. The filter chamber is separated from each of the combustion chambers. For a plurality of pixels in the output image, the method determines a corresponding pixel of either the first image or second image in the first plane. The coupling arrangement includes a data transfer wire that is connected to the meter register and is inductively coupled to the communication device such that the data transfer wire does not need to be conductively connected to the communication device.