Systems and methods for failure monitoring in a storage system. A static random access memory unit cell structure and a method of fabricating the same are also disclosed, in which, a slot contact is disposed on drains of a pull-up transistor and a pull-down transistor, and a metal-zero interconnect is disposed on the slot contact and a gate line of another pull-up transistor. The method also identifies a specific technology associated with a particular component and attaches a technology specific interceptor to the particular component based on the identified specific technology.