A multiwell plate scanner comprises a detector for measuring an attribute of a sample which is scanned continuously over wells of a multiwell plate. According to the invention, the adhesive layer is only applied annularly between the substrate and the wafer in the edge region of the wafer. In the expansion phase, the approach identifies, for each related item, a set of initial synonym candidates. It becomes also possible to easily carry out a resistance test of rice. A voltage produced across the plates is related to the detected electric field. One method includes determining a magnitude of an MRI B1+ field applied to an object, determining a phase of the MRI B1+ field applied to the object and combining the determined magnitude and phase to determine a complex B1+ field estimate.