A method according to embodiments of the invention includes providing a wafer comprising a semiconductor structure grown on a growth substrate. Each of the support assemblies includes a guide which limits the bending angle of the flexible member at the location in which it is introduced into the annular space. The methods include administering a CFTR corrector compound or pharmaceutically acceptable salt or prodrug thereof. Then at the measuring position U2, a window plate 22 is lowered onto the groove so as to determine the optical path length. The module or processor may have a memory or be connected to one. The display unit can rotate between a closed position, in which the display unit covers the keyboard, and an opened position, in which the display unit exposes the keyboard.