A circuit for measuring maximum operating frequency and its corresponding duty cycle for an input IO cell implementation under test includes a condition checking module, a central control module and a duty cycle measurement module. According to the invention, the collector region has a thickness through which transmission of the generated radiation occurs, and the collector region borders on a free surface of the semiconductor body. If it should be replaced, then the system retrieves good information from an external source and stores it into a cache memory. The pin can be snapped into an elastically deformable recess formed in a plate projecting from the male part, the shape and dimensions of which are approximately the same as those of the slot of the temple, or vice versa. The measurement method further comprises projecting a longitudinal grid of elongated foci through the volume of an object; imaging returned light from the object at a different angle on at least one camera, so as to avoid overlapping the elongated images; and analyzing the imaged, returned light to yield depth information of the object at a multiplicity of points.