A probe head for testing the properties of a semiconducting device under test including a dielectric film supporting at least one semiconducting device under test with a support frame tautly supporting the dielectric film. The pixels can be grouped into at least a first picture area and a second picture area. In response to detecting that data has been modified, the agent examines modified data containers and parses the modified data to identify new andor modified index terms or the creationdeletion of data containers. The acceleration apparatus conveys the printed products essentially in a straight line and at an angle to the conveying direction of the conveying channel.