A system and method for testing multiple smart card devices in parallel and asynchronously are provided. The provided semiconductor optical device includes an n-type InP substrate, a stack structure on the InP substrate having a waveguide and active layers, a first grating formed under the stack structure and on the InP substrate, and a second grating formed on the stack structure. The frame body has a top frame and a sidewall extending from an edge of the frame top frame. Thus, it is possible to inspect the operation of the steering lock system, while reducing the number of operating steps and the operating space. This method is similar to the first aspect of the invention, but thermodynamically compatible oligonucleotides pairs or primers that hybridize to the same sequence at a distance which is within a given range are evaluated.