An element isolation region for electrically isolating an element region where an element is to be formed is formed in a semiconductor substrate. A reduction in the number of dome switches can alternatively reduce the amount of real estate taken up by dome switches on a printed circuit board. Each of said cartridges carries an electrode for contact action on the target and delivering the electric current thereto. Thereby, consumed and dissipated power is reduced, unnecessary excessive power use is avoided, and the detection range of the obstacle detection beam is adapted to the prevailing situation. An Application Specific Integrated Circuit enables implementation of the EIS-based diagnostics, fusion algorithms, and other processes based on measurement of EIS-based parameters.