Methods of facilitating gate height uniformity by controlling recessing of dielectric material and semiconductor devices formed from the methods are provided. The one or more control signals select a number of the stages to generate a variable amplitude data output signal. The modular servers and the network switch are installed in the interior of the rack. Further, parametric yield and current level may be predicted region by region and compared with observed thermal emission to pinpoint any anomaly region in a chip to facilitate detection and correction in any mistakes in chip design.