A system and method for deriving semiconductor manufacturing process corners using surrogate simulations is disclosed. The techniques described herein provide for reducing duplication of schema elements in volatile memory by building an XML schema in-memory model that stores repeating schema elements in in-memory data structures that are separate from in-memory data structures that store the parent schema elements which logically include or otherwise refer to the repeating schema elements. A plurality of values for the parameter may be identified, and in some cases, the plurality may be ordered. The CMY values are selected based on the encoded black value in order to maintain a same color appearance image for the printed image under a normal visual light illuminant. The varicap is connected between the island structure and a base metal structure that surrounds the island structure.