By exploiting an intense correlation exhibited between the distribution of lattice distortions in a wafer and the distribution of the threshold voltages of field effect transistors, the distribution of the lattice distortions in the wafer si reduced, thereby to mitigate the distribution of the characteristics of the semiconductor elements in the wafer. By maintaining an address translation table and introducing communication between the switching control units within the multiple networks, it is possible to provide notification to the mobile station of the existence of a communication request from a first network while the mobile station coupled to the second network. A collar is arranged to couple to the reverse surface of the articulation component. A load may be connected across the circuit points under test, the sensed signals derived from a current sense amplifier, a DC voltage amplifier, a ripple amplifier, and an AC amplifier.