A device manufacturing method according to one embodiment of the invention includes positioning a reflective patterning structure to reflect at least a portion of a beam of radiation as a patterned beam of radiation having a pattern in its cross-section. In a preferred embodiment, the composition for topical administration to the patient’s skin further included hydrogen peroxide in an amount sufficient to cleanse the skin. Next, a data strobe of an automatic test system is initialized to a strobe set point relative to a system clock cycle. This allows care providers to diagnose more quickly a patient’s cardiac health through observation of the gauge without having to review all of the measured parameters. As a result, the entire resistance of the semiconductor device comprising a fin-type gate can be reduced to improve characteristics of the semiconductor device.