A multi probe card unit, a probe test device including the multi probe card unit, and methods of fabricating and using the same are provided. The transmission rate is controlled based on one or more control parameters. The cover is closed at one end to itself or to the article to which it is permanently attached. Two types of groove, grooves of a first groove group and grooves of a second groove group are formed in an external surface of the outer layer. In this case, the system stores an identifier for the reference in a register within a set of one or more registers associated with the cache memory, so that the bit error can be fixed at a later time.