A method for analyzing defect information on a substrate, including logically dividing the substrate into zones, and detecting defects on the substrate to produce the defect information. A first electrical contact is provided over the gain section to supply current to the gain section and control the output power of the light, and a second electrical contact is provided over the grating section to supply current to the grating section and control the wavelength of the emitted light. The second tab portion, in this embodiment, may include a first region and a second region, wherein the first region is positioned substantially perpendicular to the base portion, and further wherein the second region is positioned substantially perpendicular to the base portion and the first region. The first and the second TFTs are disposed on the transistor region of the transparent substrate. An image is built atop of the adhesive.