The invention relates to a method for applying at least one electrical voltage pulse to at least one reaction space by at least partially discharging at least one charge storing unit for storing electrical charges. Test data loaded by a tester into the logic product to apply to portions of combinational logic circuitry therein in order to detect faults comprises \u201ccare\u201d bits and \u201cnon-care\u201d bits. The molecular sieve preferably contains a substance which assists the clotting of blood.