In the context of charged-particle-beam microlithography methods and systems, methods are disclosed for detecting the incidence orthogonality of a patterned beam on the lithographic substrate. A flexible joint connects the first and second elongated, articulated segments. A second member is disposed with the body and engageable with the interbody implant to fix the interbody implant in a selected second configuration. The maximum error among all error values is then identified and the operating speed of a cooling fan in is set in response to this maximum error. The first outer should be removed by a carving tool or resemble tools, then the inner portion can be revealed afterwards, the main idea here is that the users can detect where the inner portion is by coloring on its surface for instance.