The present invention provides a precharge circuit that has a first precharged node, a second precharged node, and a latch device. Only when the male terminals 7 are correctly inserted into the female terminals 9, the movable elements 15 are moved to the conduction positions to be in contact with conductive portions 17 of a conduction test device 16, respectively, thereby establishing a conductive condition. The first terminal is connected to a second terminal in the fuse housing by the fusible link. Additional radius extension segments are similarly detachably-attached to the upper end of any support member to provide increased radial displacement. Unlike an ESD protection circuit, a frequency bypass circuit does not result in substantial voltage reduction across its terminals. In another embodiment an integrated three dimensional ultrasonic imaging and invasive device system is described.