A method for measuring flatness of a factory floor upon which machinery is to be mounted using a rotating laser beam that emits a rotating laser beam in an essentially horizontally plane. The compositions generally contain particles and non-surface modified nanoparticles. The image is then decomposed in different sub-bands of frequency and orientation responses using a dual-tree complex wavelet transform, and the HMT is used to model the marginal distribution of the wavelet coefficients. Further, the event is allowed if the event is authorized by the event processor. In a particular preferred embodiment the anode is fabricated in two parts, a first part having the general shape of a prior art anode with a trench shaped cavity at the top and a second part comprised of lead rich brass and disposed in the trench shape cavity. If more than one approach is successful, that which is most successful in reducing the number of symbolic parameters is selected.