Systems and methods associated with automated semiconductor fabrication device yield analysis are described. In one embodiment a rotating permanent magnet is utilized to actuate a magnetically actuated device where the magnet is not constrained to any position relative to the magnetically actuated device, such as the radial or axial position. A final threshold is computed based on values of the intermediate data points. Operative movement of a crank assembly in a first sense tensions a cable to move the lift plate towards a first end of the rail and operative movement of the crank assembly in a second sense, opposite the first sense, tensions a cable to move the lift plate towards a second end of the rail. In an initial state, a major axis direction of liquid crystal molecules in the liquid crystal layer corresponding to the first subsidiary region forms an angle of 90 degrees with respect to a major axis direction of the liquid crystal molecules in the liquid crystal layer corresponding to the second subsidiary region. In an embodiment, components of a video conferencing system can operate to provide a video signal based in part on the use of adaptive processing features which include scaling andor other pixel processing features.