A semiconductor device wherein destruction of a sealing ring caused by cracking of an interlayer dielectric film is difficult to occur, as well as a method for manufacturing the semiconductor device, are provided. A computer program is executed on a central processing unit of a computer system that includes a keyboard and a display screen. The frequency offset is measured by aligning the phase of a DCO feedback divider to the phase of a reference divider, and then counting the number of pulses in the DCO between the falling edges of the feedback to determine a frequency error.