Patterns with feature sizes of less than 50 microns are rapidly formed directly in semiconductors, particularly silicon, GaAs, indium phosphide, or single crystalline sapphire, using ultraviolet laser ablation. Information about a party originating a call to the wireless mobile is received and stored in a record associated with the wireless mobile. The tire testing apparatus 2 conducts a running test on a tire 4a using a mimic road surface body 4, and includes a side force measuring device 37 for measuring a tire side force and each actuator which gives a contact load, a side-slip angle and a camber angle, respectively. Additionally, the impeller preferably has a connective portion.