A fabricating method and a testing method of a semiconductor device and a mechanical integrity testing apparatus are provided. In an image in which a start point is set, a specified position address calculation circuit 43 stores the coordinates of the start point, and a representative point setting circuit 44 sets a representative point, and stores the coordinates thereof, and characteristic quantity of the neighborhood image. In addition, the configuration of the selection unit is adjusted according to the selection control signal and the polarity change of the data signal supplied from the data driving unit, so that color aggregation caused by supplying the same polarity voltage to adjacent color pixels of the LCD panel can be minimized.