A method and testing circuit are provided for tracking transistor stress degradation. The first type doped semiconductor structure includes a base and a plurality of columns extending outward from the base. Both simultaneous or sequential retention and release of the piston via mechanical or electromagnetic means can be controlled to actuate a plurality of pistons forward or back in an expeditious manner to overcome pneumatic losses and frictional forces in an effort to achieve more precise timing of the valve stem and optimize overall cycle time. Thereafter, the state store is stored according to the generated locations.