A device for attachment to a motor vehicle wheel includes an arrangement which, during movement or driving of the motor vehicle, detects vibrations which occur, evaluates the vibrations for an incipient fault state of a wheel bearing of the vehicle wheel, and delivers a signal when the monitoring or evaluation yields or indicates the incipient fault state. The semiconductor device test assembly can further include an air adjustment unit for adjusting an air pressure in the outer bellow, so as to adjust a contact force between the heat sink and the device under test. An AC-coupled charging capacitor is also included in the gate drive circuit. The dynamic mask can be configured to change its structure dynamically, and the first radiation pattern can be different from the second radiation pattern.