Various processes or modules described herein enable the schematic design tools to obtain physical data of a physical design and to perform one or more simulations in the schematic domain with such physical data such that the schematic design tools are made electrically aware of the physical data. Then a group III nitride compound semiconductor represented by a general formula AlxGayIn1\u2212x\u2212yN is laminated thereon. The method may further include receiving a key to unlock the locked data such that the data is available to the image display device. The stress layer thickness is below that which results in spontaneous spalling of the source substrate. If the virtual address is not within a range of addresses for which the requesting device is authorized to access, the firmware denies the request.