A device for evaluating at least one analyte in a test sample. The identification character register is read out in an examination step and is compared with an expected value. The computing device causes an action to take place based on the comparison between the voltage stability margin index and the pre-set threshold. The second bias circuit generates a second bias voltage lower than a feedback voltage relating to the output voltage. The source substrate may comprise an inorganic single crystal or polycrystalline material such as Si, Ge, GaAs, SiC, sapphire, or GaN. The etching is selective to the sacrificial layer to prevent the removal of the nanowire, and the etching causes the portion of the nanowire to be suspended over the semiconductor substrate.