In a method of manufacturing a probe card, a plurality of probe modules, including a sacrificial substrate and probes on the sacrificial substrate, is prepared. A plurality of asymmetric filtering is performed on an input depth map to obtain a plurality of asymmetric filtering results. A melt spun ribbon 8 is formed by injecting the molten alloy 6 from the nozzle 6 so as to be collided with the circumferential surface 53 of the cooling roll 5, so that the molten alloy 6 is cooled and then solidified. The third circuit is generally configured to calculate an errata polynomial based on the normal syndromes.