The present invention provides an electrical programmable metal resistor and a method of fabricating the same in which electromigration stress is used to create voids in the structure that increase the electrical resistance of the resistor. The problem occurs most pronouncedly between sets of adjacent memory cells that have been programmed at different times. In some preferred embodiments, the probe card assembly structures include separable standard components, which reduce assembly manufacturing cost and manufacturing time. In this way, the pitch of the contacts can be half that of the first contact holes.