A self-repairing memristor and methods of operating a memristor, and repairing a memristor, employ thermal annealing. In some embodiments, the methods involve testing for the presence of protein in the suspect sample; optionally, the sample can also be tested for the presence of sugar, andor for pH determination. In one embodiment, the method includes receiving a selection of a storage cell of the DRAM; measuring a storage cell capacitance of the storage cell; measuring a local bitline capacitance of the storage cell; measuring a transfer device voltage of the storage cell; computing a transfer ratio for the storage cell; and measuring a data retention time for the storage cell. With this, the spatial position of the object is determined in a quick and contactless manner. The drive circuit is configured to apply a voltage between the electrodes. Correspondingly, the device can again be brought to the normal state by moving the sliding lid back on top of the display or the display to underneath the sliding lid, whereupon the cogged surfaces that touch against each other cause the remaining moving element to move, and again bring the device to the normal state.