The invention includes methods of forming layers conformally over undulating surface topographies associated with semiconductor substrates. In the film, a light-scattering characteristic F represents a relationship between the light-scattering angle \u03b8 and a scattered light intensity F fulfills FyFx\u22671. In one embodiment, one or more of the base stations may include an augmented base station and include means for communicating with the user stations over an alternative communication path distinct from a spread-spectrum path, such as over a cellular communication path.