A X-ray scattering measurement device and measurement method can measure, with high resolution, the intensity of X-rays which have undergone small-angle scattering and diffraction with reflection geometry and can easily and accurately measure a microstructure on the surface of a sample. After a reset operation of the signal charge accumulation portion is performed in all the pixels arranged in the matrix, a charge accumulation operation by the photodiode is performed in all the pixels, and a read operation of a signal from the pixel is performed per row. In one embodiment, both the incoming data to be written to a bit and the data currently present at that bit address are latched. The size of the particulate matter and the unburnt carbon percentage in the particulate matter are determined as a function of the calculated scattered light polarization ratios. In response to the first access transaction being a read transaction, the read transaction is not issued to the peripheral device until the second processor executes the instruction. Surface contact pads may be provided on the contact end including force contact pads, each contacting and extending along aligned flush portions of the force conductor planes, and including return conductor pads, each contacting and extending along aligned flush portions of the return conductor planes.