A circuit is tested for latch-up by scanning an optical beam across the surface, supplying power to the integrated circuit, monitoring the power of the power supply, and detecting latch-up in the integrated circuit by capturing an image of the integrated circuit when the power reaches a predetermined threshold. Moreover, a bias magnetic field having such a level that does not destroy storage data is applied to the selected memory cell. The transmission control unit is further configured to order the radio communication unit to reduce the size of following variable downlink time intervals according to an interference reduction scheme for obtaining time intervals with a guaranteed reduced size if interference from another base station is present. Image processing is performed on the detected scattered radiation to determine whether an anomaly is present and to locate the anomaly and its characteristics.