Disclosed are apparatus and methods of reducing insertion loss, passivation, planarization and in-wafer testing of integrated optical components and in-wafer chips in photonic integrated circuits. An aluminum nitrate solution is provided. For data communication purposes, the carrier signal is pulse modulated at selected pulse repetition frequencies with the selected PRF transmitted as first-order sideband components of the fixed carrier frequency. The modulation circuit modulates the square wave pulse signal to generate a modulated wave signal and transmits the modulated wave signal to the metal detection circuit of the power supply device. The DLL functions are managed across a computer network through an administrator interface to create the functions and a viewer interface that combines an Explorer\xae window to select the functions and a spreadsheet window for the actual spreadsheet program that implements the DLL functions.