Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. The panel includes a substrate holding an electro-optical material, a side of the electro-optical panel for displaying an image having a display area and a non-display area. The multimode device can utilize its scan optimizer to generate an optimized scan schedule to be employed for a limited duration during a network search to improve its likelihood of success in detecting andor attaching to a network associated with a prioritized RAT. A conductor in the first channel may have a conductor width substantially equivalent to a conductor width of a conductor in the second channel.