A pixel array includes a plurality of pixel groups, each of which includes a plurality of brightness sub-pixel regions, a plurality of first sub-pixel regions, and a plurality of second sub-pixel regions. A work flow manager is established for automatically managing the automated software test environment. The scan rate may be desynchronized from the TDI sample clock rate by altering the speed of wafer movement, the sample clock rate, or the magnification of the imaging optics. The method further includes, when the first data segment contains an uncorrectable error bit, loading a first data segment of a second program code copy, and then loading a second data segment of the first program code copy or the second program code copy.