Methods and systems for use of an optical display system as an indicator of a wearable computing device are provided. An insulative base is disposed within a casing and includes a top complex, a center complex, and a bottom complex in sequential connection. The system then provides the setup information to a process measurement system for use in measuring production wafers in a semiconductor manufacturing process. An SLM receives the output from the SLM addressing optics and provides localized phased shifting of the resulting wavefront. The system includes a first display that shows the speed of vehicles in the first area, such as the opposite lane in front of the patrol vehicle, and a second display that shows the speed of vehicles in the second area, such as the same lane behind the patrol vehicle.