A system and method is disclosed for enforcing a third-party factory test during a quality verification of a newly-manufactured computing device. The device may include multiple optical detectors and the movable device may include light sources. Further, each data recognition FIR-Filter can include a weighting unit for weighting data samples of the deserialized data stream, a summing unit for summing up the weighted data samples, and a comparator unit for comparing the summed up data samples with a threshold value. Systems and methods may alternatively, or additionally, sense current and adjust the applied voltage to obtain a target current. Typically, the graft copolymer will comprise one glass transition temperature below ambient temperature and another second glass transition temperature above ambient temperature. The present invention implements statistical adddrop multiplexing for multiple data services in various types, and can be used in implementing a statistical ADM for diverse data services in burst mode, even a statistical ADM for multiple mixed services.