1460991271-baaef351-baec-4575-ad8e-3e391872cece

A novel measurement method is provided capable of measuring characteristics of semiconductor integrated circuit devices without incurring the influence of external measuring means. Lowering the magnetic domain wall movement current and drive at room temperature in a current induction single magnetic domain wall movement phenomenon are achieved. The controller is configured to: determine a signal-to-noise ratio as a function of the sound levels detected by the microphone, and transmit via the wireless transmitter a first command to adjust the volume output of the audio device if the signal-to-noise ratio passes the first threshold.