A semiconductor parametric testing apparatus includes designating a die and module on each wafer at which a test should be paused and pausing a test at the preselected die and module on each wafer. Backer plate may either be molded of insulative material or be conductive to serve as a ground connection. The vinylidene isomer content of the product may range from 20% to 70% thereof and the content of tetra-substituted internal double bonds is very low, preferably less than about 5% and ideally less than about 1\u20132%. There also is an inlet at a first location of the vessel and an outlet at a second location of the vessel. Further, an intermediary application is used to cause a client to save state information for any range of Uniform Resource Locators, and to cause the client to send any previously stored state information to the intermediary application.