A method and system for determining polycrystalline silicon chunk size for use with a Czochralski silicon growing process. According to the present invention, an antireflective film in which an antireflective layer is stacked on a transparent resin substrate and exhibits excellent antireflective performance, tenacity, and surface hardness, a polarizer plate using the antireflective film, and a display including the polarizer plate are provided. The chest member and the hip member may be selectively interconnected to each other with an interconnection member.