The subject invention relates to broadband optical metrology tools for performing measurements of patterned thin films on semiconductor integrated circuits. The compounds fall within a genus described by formula I:. Other ingredients may also be added, for example, sodium lignosulphonate, calcium lignosulphonate and the like for modifying the physical structure of soils. The first connecting module can be released from the second connecting module by means of a movement of the first connecting module or a part of the first connecting module in an opening direction that differs from the closing direction. Each logic path of the second plurality of logic paths comprises two transistors.