1460413406-2f254863-8ca5-441d-bd9b-7d6da30379a6

A method and apparatus for testing unpackaged semiconductor dice having raised contact locations are disclosed. In one embodiment, the adapter includes a threaded attaching portion and an engaging cylinder. An expansion balloon which can be expanded with a pressurised fluid is located inside the metal grid and can be subjected to the action of the pressurised fluid through a pressurised fluid delivery tube that is preferably guided through the connecting tube, for the purpose of expanding the metal screen.